Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV: 23-24 September, 1998, Santa Clara, California (Spie Proceedings Series)

• ISBN 10: 0819429694
• ISBN 13: 9780819429698
• Release: May 19, 1998
• Format: Paperback (240 pages)
• List Price: $32.00
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  List Price: $32.00

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