Noncontact Atomic Force Microscopy

• ISBN 10: 3540431179
• ISBN 13: 9783540431176
• Edition: 2002
• Release: September 17, 2002
• Format: Hardcover (439 pages)
• List Price: $215.00
• More Details
  
  

  List Price: $215.00

  Tags: Science, General,

  Book Description:
  Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

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