Scanning Electron Microscopy and X-ray Microanalysis
- Author: Joseph Goldstein - Goldstein - David C. Joy - Dale E. Newbury - Patrick Echlin - Eric Lifshin - Charles E. Lyman - L.C. Sawyer - J.R. Michael - Mark Staniforth - J.R. - Linda Sawyer - Joseph; Newbury - Dale E.; Joy - David C.; Lyman - Charles E.; Echlin - Patrick; Lifshin - Eric; Sawyer - Linda; Michael
- ISBN 10: 0306472929
- ISBN 13: 9780306472923
- Edition: 3rd
- Release: 0000-00-00
- Format: Hardcover (689 pages)
- List Price: $84.95
- Tags: Science, Biological Sciences, Biology,
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Book Description:
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
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